Vadzo Imaging Unveils World’s First 13MP Autofocus USB 3.2 Gen 2×2 Camera for High-Speed Industrial Imaging

Ultra Fast 20Gbps USB 3.2 Gen 2×2 Camera Type C | Onsemi AR1335 Color Camera | ROI Based Autofocus and Auto Exposure | ...
Tech Xplore

AI enables defect-aware prediction of metal 3D-printed part quality

A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science ...
IEEE

Defect Detection in Patterned Wafers Using Dynamic Local Adaptive Sensitivity Adjustment

Abstract: In the defect detection of patterned wafers, optical images captured by inspection systems are affected by various noises, resulting in low signal-to-noise ratios in the obtained images, ...
Tech Xplore

Electron microscopy shows 'mouse bite' defects in semiconductors

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...
IEEE

Ultrasonic Tomography System for Nut Defect Detection Using Linear Arrays

Abstract: Conventional phased-array ultrasound can detect defects in nuts; however, accurately reconstructing their irregular shapes and precise spatial structures remains challenging. To faithfully ...