In the 1990s, Carnegie Mellon researchers created a comprehensive scan-test cost model that demonstrated how design for test (DFT) contributes to profitability (Ref. 1). With scan compression in wide ...
About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.
With advanced technology nodes, the SoCs are growing in density and gate count. This creates challenges regarding the testability, and more importantly, the test cost. The design complexity and size ...
Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...
HiDFT-Scan Analyzes, Implements Scan Test Structures in Register-Transfer Level Designs; Closes Historical Gap between RTL and DFT PALO ALTO, Calif.--October 22, 2007--DeFacTo Technologies today ...
In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...
Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results