STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

IC test interface specialist WinWay Technology is expected to generate significant growth in probe card sales next year, thanks to strong demand for VPC (vertical probe card) and MEMS products, ...

POWAY, Calif.--(BUSINESS WIRE)-- Cohu, Inc. (NASDAQ: COHU), a global supplier of equipment and services optimizing semiconductor manufacturing yield and productivity, today announced a strategic ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

HSINCHU, June 14, 2023 /PRNewswire/ -- STAr Technologies, a leading test system and probe card supplier to semiconductor industry, today announced the opening of a new probe card demo and potential ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Acquisition adds both high-frequency RF and fine-pitch technology to PTSL, enabling automotive radar and high-performance test applications. ThinkMEMS offers unique process IP, combining the ...

A steady stream of advances has elevated test and measurement instruments to the point where they can reveal minute details of signals with lightning-quick rise and fall times. So, then, what about ...

Q1 2025 Management View CEO Mike Slessor reported that FormFactor experienced sequentially lower revenue and profitability in Q1 2025 due to reduced demand in DRAM probe cards and systems. However, he ...