Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
FormFactor has introduced DC-Boost, an advanced TRE test technology to increase probe test capacity. The new wafer-probe-card capability enables more efficient use of tester channels on test equipment ...
Harmony eXP, a full-wafer-contact probe card from FormFactor, can test more than 1000 DRAM devices per touchdown and is capable (for some device designs) of supporting one-touchdown testing of a full ...
LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
Probe cards come in various types, including cantilever, membrane, and vertical designs, catering to different testing needs. Memory testing, power device testing, and calibration are essential ...
STAr Technologies, a leading test system and probe card supplier to semiconductor industry, today announced the opening of a new probe card demo and potential test services center in the key ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
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