This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...

In-circuit test (ICT) is a time-tested and proven method of testing PCBs. During ICT, a bed-of-nails fixture provides test-instrument access to PCB nodes. Each nail is positioned such that, when the ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

Wireless fixtures for in-circuit testing (ICT) have been available for more than 15 years and have no equal in testing high node-count complex circuit boards. However, there are other hidden ...

The August print issue of EE-Evaluation Engineering includes a special report on power electronics test. In preparation for that article, we asked test equipment vendors to provide information on ...