Functional safety is a major challenge for field programmable gate arrays (FPGAs) and other semiconductor designs. Safety requirements go beyond traditional verification, which focuses on design bugs.
The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...
This is the second part of a two-part discussion (Part 1 appeared in August) in which the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs. These elements ...
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