AI fault detection uses waveform analytics and machine learning to identify early electrical failure signatures in distribution systems. Utilities gain predictive insight into incipient faults, asset ...

Incipient fault detection using AI classification represents a fundamental advancement in distribution system reliability engineering. By continuously analyzing waveform behavior and classifying ...

Functional safety is a major challenge for field programmable gate arrays (FPGAs) and other semiconductor designs. Safety requirements go beyond traditional verification, which focuses on design bugs.

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.