The B4655A FPGA dynamic probe application works with the company’s logic analyzers to debug Xilinx FPGAs, including the Virtex-II, Virtex-II Pro, and Spartan-3 families. Interacting with on-chip ...
Hysitron nanoDMA III from Bruker is the latest powerful dynamic testing method to perform nanoscale mechanical property measurements. nanoDMA III is fitted with the recently developed CMX control ...
New Analysis Environment for Multi-Gigabit Transceivers in Virtex-4 and Virtex-5 Platforms Delivers Ease-of-Use and Productivity Boost to System Designers The new tool will be used by design teams in ...
The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...
Colorado Springs, Colo. — Agilent Technologies Inc. is making the first major expansion of its 169xx line of mainframe logic analyzers in two years, adding deeper memory to support high-speed serial ...
A selection of probes, from [Jim Williams’] Linear Technology app note 72. It’s not often that we are shown an entirely new class of test equipment here at Hackaday, so it was with some surprise that ...
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