Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Solar energy is a crucial part of our clean energy future, but a new, highly efficient solar material has a hurdle that needs to be addressed. A recent study reveals how a microscopic weak spot can ...