When asked, many engineers will say that the goal of a test plan for a PCB is full or 100% test coverage. When pressed further, they usually admit that 100% test coverage is virtually impossible to ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

The Alaska Department of Transportation & Public Facilities is on the front line when it comes to promoting new technologies that give them continuous, full-coverage asphalt pavement density testing ...

New research paper titled “Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification” from researchers at University of Bristol and Infineon Technologies. “Constrained ...

While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult ...